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. 2013 May 8;73(5):2404. doi: 10.1140/epjc/s10052-013-2404-z

Table 11.

Sources of systematic uncertainties for the ANN method and their effects on the background prediction in bins of Inline graphic. The total uncertainty is the individual uncertainties summed in quadrature

Inline graphic range [GeV] [350–500)
(%)
≥500
(%)
Jet and Inline graphic energy scale 3 4
Lepton p T scale 3 5
Lepton efficiency 0.3 0.4
\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$\sigma(\mathrm{t}\overline{\mathrm{t}})$\end{document} and σ(W) 3 2
W polarization in W+jets 1 3
W boson p T spectrum in W+jets 10 2
\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$\mathrm{t}\overline{\mathrm{t}}$\end{document} (ℓℓ) 1 7
Other backgrounds 1 1
SM simulation statistics 15 23
Total systematic uncertainty 19 26