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. 2013 May 8;73(5):2404. doi: 10.1140/epjc/s10052-013-2404-z

Table 6.

Event yields in data and MC simulation for the muon sample. The results in the columns labeled “Total MC” are listed for reference only. The corresponding uncertainties statistical only

\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$S_{\mathrm{T}}^{\mathrm{lep}}$\end{document} range [GeV] Total MC Data Total MC SM estimate Data
Control region (L P>0.3) Signal region (L P<0.15)
500<H T<750 GeV
[150–250) 1465±11 1297 261±3.2 261±7±24 258
[250–350) 452±5.2 383 99.3±2.1 84.1±4.2±7.3 78
[350–450) 154±3.1 128 40.2±1.4 33.3±3.0±2.6 23
≥450 59.2±1.8 50 18.6±1.0 15.7±2.2±2.0 16
750<H T<1000 GeV
[150–250) 280±4.1 218 52.4±1.6 40.8±2.9±3.5 46
[250–350) 91.9±2.1 88 22.3±0.9 21.3±2.3±2.2 22
[350–450) 34.6±1.3 25 10.3±0.6 7.5±1.5±1.0 8
≥450 26.7±1.4 18 8.8±0.6 5.9±1.4±0.7 7
1000 GeV<H T
[150–250) 92.3±2.5 76 20.5±1.0 16.9±1.9±1.7 15
[250–350) 32.9±1.3 31 8.7±0.8 8.2±1.5±1.0 8
[350–450) 10.9±0.7 7 4.6±0.4 2.9±1.1±0.6 1
≥450 11.9±0.8 12 4.6±0.5 4.6±1.4±0.7 2