Table 7.

Event yields in data and predictions of the numbers of EWK and QCD events for the electron sample in bins of H _T. The sum of predicted EWK events and predicted QCD events in the control region is constrained to be equal to the total number of data events. The background estimate used in comparing to the yields in the data is the result of the procedure described earlier and is listed in the row labeled “SM estimate”. The uncertainties for the QCD and EWK background estimates are statistical only. The uncertainties shown for the SM estimate are first the statistical uncertainty from the control region fit and second all other systematic uncertainties

\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$S_{\mathrm{T}}^{\mathrm{lep}}$\end{document} range [GeV]	QCD	EWK	Data	QCD	EWK	SM estimate	Data
	Control region (L P>0.3)			Signal region (L P<0.15)
500<H T<750 GeV
[150–250)	184±33	1122±45	1306	9.1±1.6	170±7	179±7±18	204
[250–350)	66±15	334±22	400	2.1±0.5	63.3±4.1	65.3±4.3±5.9	71
[350–450)	26.6±7.6	93±11	120	0.3±0.1	19.2±2.3	19.4±2.4±2.9	29
≥450	17.1±5.1	33.9±6.6	51	0.2±0.0	9.0±1.8	9.2±1.9±1.7	11
750<H T<1000 GeV
[150–250)	39±15	210±20	249	1.9±0.7	35.1±3.3	37.0±3.5±4.8	37
[250–350)	5.8±5.5	59.2±9.1	65	0.2±0.2	11.0±1.7	11.2±2.0±1.8	13
[350–450)	<0.1	26.0±5.1	26	<0.1	6.3±1.2	6.3±1.2±1.5	5
≥450	8.7±3.4	22.3±5.0	31	0.1±0.0	6.7±1.5	6.8±1.6±1.5	5
1000 GeV<H T
[150–250)	14.9±7.7	62±10	77	0.7±0.4	11.7±1.9	12.5±2.2±2.4	9
[250–350)	10.4±4.3	20.6±5.4	31	0.3±0.1	4.5±1.2	4.8±1.5±1.1	8
[350–450)	0.5±1.7	11.5±3.7	12	<0.1	2.6±0.8	2.6±1.2±0.9	1
≥450	4.4±2.5	6.6±2.9	11	0.0±0.0	2.5±1.1	2.6±1.3±0.9	1