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. 2014 Mar 18;46(10-11):936–939. doi: 10.1002/sia.5429

Figure 2.

Figure 2

Typical depth profile of the ONA reference material showing the [Alq3 + H]+ secondary ion intensity (black dots) and a fit with four summed Dowsett response functions (red line); b) corresponding plot of the known central depth of each Alq3 layer against the sputter dose required to reach the maximum [Alq3 + H]+ secondary ion intensity (black squares) and the linear fit to the data (red line).