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. 2015 Mar 16;6:6567. doi: 10.1038/ncomms7567

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(a) The XRD patterns of np-CuTi and Ti-free np-Cu. Inset: the enlarged region of Cu (111) diffraction peaks, with the dotted line indicating the peak position of pure Cu. (b) High-angle annular dark-field (HAADF) scanning (S)TEM image of a cross-sectioned np-CuTi sample prepared using FIB technique. Scale bar, 1 μm. (c), HAADF STEM image with a higher magnification. The box indicates the region selected for EELS study. Scale bar, 50 nm. (d–f) The contrast image of the selected region for EELS mapping study and its corresponding Cu (e) and Ti (f) maps. Scale bar, 50 nm. (g) High-resolution TEM image with visible lattice fringes. Inset: The Fourier transform confirms that np-CuTi is composed of an extended crystalline network. Scale bar, 2 nm.