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. 2015 Mar 19;10:137. doi: 10.1186/s11671-015-0798-2

Table 1.

The structures of samples

Before deposition After deposition
PE-SA-1 80 nm a-Si:H/Si 30 nm Al2O3 (210 cycles) + 80 nm a-Si:H/Si
PE-SA-2 80 nm a-Si:H/Si 10 nm Al2O3 (85 cycles) + 80 nm a-Si:H/Si
T-SA-1 170 nm a-Si:H/Si 30 nm Al2O3 (200 cycles) + 170 nm a-Si:H/Si

The numbers of ALD deposition cycles are shown behind the Al2O3 film thickness.