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. Author manuscript; available in PMC: 2015 Apr 7.
Published in final edited form as: Angew Chem Int Ed Engl. 2014 Jun 18;53(31):8093–8098. doi: 10.1002/anie.201403702

Figure 2.

Figure 2

Depth profiling XPS analysis of sulfur content using a C60+ ion bombardment of Lys x-linked + 20 Barrier Layer Films. Stacked spectra in the S2p region after 1, 20, 40, 50, 60, and 80 cycles corresponding to probe depths of approximately 7 nm, 131 nm, 263 nm, 328 nm, 394 nm, and 525 nm, respectively (A). Integrated S2p area counts after every sputter cycle is shown as a function of probe depth from the film surface (B).