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. Author manuscript; available in PMC: 2016 May 1.
Published in final edited form as: Micron. 2015 Feb 13;72:15–20. doi: 10.1016/j.micron.2015.01.004

Figure 2.

Figure 2

Atomic force microscopy (AFM) and near-field scanning optical microscopy (NSOM) of Jurkat cells exposed to nanosecond pulsed electric fields (nsPEFs). (A–C) AFM height images of cells exposed to 0, 15, and 60 kV/cm nsPEFs, respectively. (D–F) NSOM images of Jurkat cells exposed to 0, 15, and 60 kV/cm nsPEFs, respectively. (G–I) AFM phase images of Jurkat cells exposed to 0, 15, and 60 kV/cm nsPEFs, respectively. (J–L) Three-dimensional representations based on AFM height measurements of Jurkat cells exposed to 0, 15, and 60 kV/cm nsPEFs, respectively.