Fig. 2.

(a) Axial sectioning profiles for the line-scanning system (red), shown in comparison with point-scanning (green) and widefield illumination (blue). The line-scanning profile exhibits a full-width half-maximum only slightly larger than the point-scanning system, but with a significantly increased tail. The gentle fall-off in the widefield profile is due to simple geometric effects. (b) USAF resolution target, showing group 7 elements 2-6 and group 6 element 1, imaged with the line-scanning system. The target was back-illuminated by a green LED. The insets show a zoom on part of the target, with (top) and without (bottom) fiber-pattern removal by spatial filtering. Scale bar is 50 µm.