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. 2015 Apr 10;6:6824. doi: 10.1038/ncomms7824

Figure 1. Phase identification by STEM-EDX.

Figure 1

(a) High angle annular dark-field (HAADF) image showing the area of EDX mapping, (be) EDX element mapping in STEM mode for Ce, Gd, Co, Fe elements and (f) phase distinguishable map after combining the EDX signals of be for the CGO–CFO5050 sample; (gl) and (mr) are corresponding results for CGO–CFO6040 and CGO–CFO8020 samples, respectively. Scale bars, 1 μm.