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. 2015 Apr 24;5:9932. doi: 10.1038/srep09932

Figure 2. TEM images of QDs.

Figure 2

(a) TEM image of Si QDs embedded in SiyNx after irradiation under electron beam for 15min on amorphous Si film prepared in nitrogen gas. (b) TEM image of Si–Yb QDs embedded in SiyNx after irradiation under electron beam for 20min.