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. 2015 Jun 6;5(3):20140083. doi: 10.1098/rsfs.2014.0083

Figure 1.

Figure 1.

Scanning electron micrographs from secondary electrons (SEI) (top view and inset: cross-section) of NiO films. (a) A triple layer of NiO synthesized with PS-b-P2VP as template; (b--d) F108-templated NiO with increasing number of layers from 1 to 3.