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. 2015 Apr 28;9:161. doi: 10.3389/fncel.2015.00161

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Copyright © 2015 Ferreira, Yousuf, Dalton and Sheets.

This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) or licensor are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.

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Comparison of subthreshold properties as a function of cortical depth in IL and resonant frequency. (A) Schematic showing the subclasses of neurons tested. (B) Input resistance, (C) resonant frequency, and (D) voltage sag as a function of normalized (pia = 0, white matter = 1) soma location for projection neuron classes. Mean normalized location of laminar borders are indicated with dashed gray lines. Plots of resonant frequency values versus (E) input resistance (R_IN), (F) resting membrane potential, and (G) voltage sag percentage. High res = high resonators; low res = low resonators.

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