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. 2015 Apr 18;10:188. doi: 10.1186/s11671-015-0880-9

Figure 14.

Figure 14

Statistical distribution of LRS under V > V SET (SET condition) and HRS under V < V RESET (RESET condition). (a) 20-nm (shown in the inset) and (b) 50-nm cell in Cu-Te/GdOx CBRAM devices [24].