Table 1. X-ray parameters and capabilities of the XPP instrument.
| Instrument name | XPP |
| Mirrors, incidence angle | 2 SiC on Si, 1.32mrad |
Monochromaticity ( )†
|
 (SASE),  (seeding) |
| Energy range (keV) | 4 to 11 (fundamental) |
| Unfocused beam size (m) | 500 at 8.3keV |
| Focused beam size (m) | 2500 |
| Focusing capability | Be lenses, 1D and 2D focusing |
| Flux (photons pulse1) |
 (fundamental‡) |
| Pulse length (fs) | 5200 |
| Repetition rate | 120, 60, 30, 10, 5, 1, on demand |
| Optical laser pulse energy (mJ) | 20 (800nm), 45 (400nm), 1 (266nm) |
| Optical laser pulse width (fs) | 10150 |
| Standard detectors | CSPAD, CSPAD-140K, ePix, Rayonix, ORCA, PIPS diodes |
| Sample environment | Huber three-circle goniometer, kappa diffractometer, general purpose vacuum chamber, liquid jet, He enclosure, Oxford LN2 cryojet down to 100K |
†
Typical single-shot value.
‡
Excluding beamline and instrument transmission.