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. 2015 Apr 15;22(Pt 3):514–519. doi: 10.1107/S160057751500449X

Table 1. X-ray parameters and capabilities of the CXI instrument.

Instrument name CXI
Mirrors, maximum incidence angle 2 SiC on Si, 3.4mrad
Monochromaticity (Inline graphic) Inline graphic (SASE), Inline graphic (seeded)
Energy range (keV) 511 (fundamental)
Unfocused beam size (m) 800 at 8.3keV
Focused beam size (m) 10, 1, 0.1
Focusing optics Be lenses, one- and two-dimensional focusing
Fixed Si 1m KB pair
Fixed Si 100nm KB pair
Flux (photons per pulse) 1 1012 (fundamental)
Pulse length (fs) 5200, 40 nominal
Repetition rate (Hz) 120, 60, 30, 10, 5, 1, on demand
Optical laser pulse energy (mJ) 3 (800nm), 0.6 (400nm), 0.15 (266nm)
Optical laser pulse width (fs) 10150
Standard detectors CSPAD (2), CSPAD-140k
Sample delivery Aerodynamic lens injector for fine aerosols
Gas dynamic virtual nozzle
High-viscosity injectors
In-vacuum fixed target stages
Spectrometer Ion time-of-flight
X-ray emission spectrometer

Typical single-shot value.

Excluding beamline and instrument transmission.