Table 1. X-ray parameters and capabilities of the CXI instrument.
Instrument name | CXI |
Mirrors, maximum incidence angle | 2 SiC on Si, 3.4mrad |
Monochromaticity ()† | (SASE), (seeded) |
Energy range (keV) | 511 (fundamental) |
Unfocused beam size (m) | 800 at 8.3keV |
Focused beam size (m) | 10, 1, 0.1 |
Focusing optics | Be lenses, one- and two-dimensional focusing |
Fixed Si 1m KB pair | |
Fixed Si 100nm KB pair | |
Flux (photons per pulse) | 1 1012 (fundamental‡) |
Pulse length (fs) | 5200, 40 nominal |
Repetition rate (Hz) | 120, 60, 30, 10, 5, 1, on demand |
Optical laser pulse energy (mJ) | 3 (800nm), 0.6 (400nm), 0.15 (266nm) |
Optical laser pulse width (fs) | 10150 |
Standard detectors | CSPAD (2), CSPAD-140k |
Sample delivery | Aerodynamic lens injector for fine aerosols |
Gas dynamic virtual nozzle | |
High-viscosity injectors | |
In-vacuum fixed target stages | |
Spectrometer | Ion time-of-flight |
X-ray emission spectrometer |
Typical single-shot value.
Excluding beamline and instrument transmission.