Table 1. X-ray parameters and capabilities of the MEC instrument.
| Instrument name | MEC |
| Mirrors, incidence angle | 3 SiC on Si, 1.32mrad |
Monochromaticity ( )†
|
(SASE), (seeded) |
| Energy range (keV) | 2.5 to 11.0 (fundamental) |
| Unfocused beam size (m) | 1000 at 8keV |
| Focused beam size (m) | 2.0 to 100.0 |
| Focusing optics | Be lenses, 1D and 2D focusing |
| Flux (photonspulse1) |
(fundamental‡) |
| Pulse length (fs) | 5200 |
| Repetition rate (Hz) | 120, 60, 30, 10, 5, 1, on demand |
| Optical laser parameters | Ti:sapphire laser: 1J, 50fs, 5Hz, 800nm |
Glass laser: 2 25J, 2100ns, 527nm, 1shot every 7min |
|
| Standard detectors | CSPAD-140k, CSPAD-560k, |
| Princeton MTE-2048 and MTE-1300 | |
| Standard diagnostics | VISAR, FDI, X-ray Thomson scattering spectrometers |
| XUV spectrometer, phase-contrast imaging diagnostic |
Typical single-shot value.
Excluding beamline and instrument transmission.




