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. 2015 Apr 21;22(Pt 3):520–525. doi: 10.1107/S1600577515004865

Table 1. X-ray parameters and capabilities of the MEC instrument.

Instrument name MEC
Mirrors, incidence angle 3 SiC on Si, 1.32mrad
Monochromaticity (Inline graphic) Inline graphic (SASE), Inline graphic (seeded)
Energy range (keV) 2.5 to 11.0 (fundamental)
Unfocused beam size (m) 1000 at 8keV
Focused beam size (m) 2.0 to 100.0
Focusing optics Be lenses, 1D and 2D focusing
Flux (photonspulse1) Inline graphic (fundamental)
Pulse length (fs) 5200
Repetition rate (Hz) 120, 60, 30, 10, 5, 1, on demand
Optical laser parameters Ti:sapphire laser: 1J, 50fs, 5Hz, 800nm
  Glass laser: 2Inline graphic 25J, 2100ns, 527nm, 1shot every 7min
Standard detectors CSPAD-140k, CSPAD-560k,
  Princeton MTE-2048 and MTE-1300
Standard diagnostics VISAR, FDI, X-ray Thomson scattering spectrometers
  XUV spectrometer, phase-contrast imaging diagnostic

Typical single-shot value.

Excluding beamline and instrument transmission.