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. 2015 Apr 23;22(Pt 3):819–827. doi: 10.1107/S1600577515005524

Figure 2.

Figure 2

(a) Diffraction pattern from a vertically oriented NRA measured at 500 eV and Inline graphic = 100 µm. The white rectangle indicates the area used for the analysis. (b) The Fourier transform of the NRA diffraction pattern. Both images are displayed on a logarithmic scale. (Inset) Optical microscope image of the NRA and its aperture separations shown in micrometers.