Figure 2.

Diffraction patterns of parasite and background scattering recorded without an attenuator (a) and from a copper oxide particle with an attenuator of 50 µm thickness (transmission 15%) in front of the MPCCD-Dual detector (b). These patterns were collected after positional tuning of the Si slits relative to the incident X-rays. (c) Comparison of intensity profiles along the lines indicated by arrows in (a) and (b). The green and red curves are profiles from (a) and (b), respectively. (d) Thermal and readout noise of detector panels as an average of 100 times accumulation. It should be noted that noise levels are different between readout ports.