Table 5.
Summary of the systematic uncertainties taken into account for the total expected number of events. Values are provided at = 1 TeV (2 TeV) to give representative estimates relevant to this search. The PDF variation values shown for signal are based on CI. For the ADD signal they are uniform at 6 % and 3 % in the dielectron and dimuon channels, respectively. Signal systematic uncertainties are assessed as a function of the corresponding parameter of interest but are not found to vary greatly. N/A indicates that the uncertainty is not applicable
| Source | Dielectrons | Dimuons | ||
|---|---|---|---|---|
| Signal | Background | Signal | Background | |
| Normalization | 4.0 % (4.0 %) | N/A | 4.0 % (4.0 %) | N/A |
| PDF Variation | 0.1 % (0.2 %) | 5.0 % (11.0 %) | 0.1 % (0.1 %) | 5.0 % (12.0 %) |
| PDF Choice | N/A | 1.0 % (7.0 %) | N/A | 1.0 % (6.0 %) |
| N/A | 1.0 % (3.0 %) | N/A | 1.0 % (3.0 %) | |
| EW Corrections | N/A | 1.0 % (2.0 %) | N/A | 1.0 % (3.0 %) |
| Photon-Induced | N/A | 7.0 % (12.0 %) | N/A | 6.5 % (9.5 %) |
| Efficiency | 1.0 % (2.0 %) | 1.0 % (2.0 %) | 3.0 % (6.0 %) | 3.0 % (6.0 %) |
| Scale & Resolution | 1.2 % (2.4 %) | 1.2 % (2.4 %) | 1.0 % (4.0 %) | 1.0 % (4.0 %) |
| Electron Charge Misident. | 1.2 % (2.0 %) | 1.2 % (2.0 %) | N/A | N/A |
| Multi-Jet & +Jets | N/A | 3.0 % (5.0 %) | N/A | N/A |
| Beam Energy | 1.0 % (3.0 %) | 1.0 % (3.0 %) | 1.0 % (3.0 %) | 2.0 % (3.0 %) |
| MC Statistics | 3.0 % (3.0 %) | 0.5 % (0.5 %) | 3.0 % (3.0 %) | 0.5 % (0.5 %) |
| Total | 5.5 % (6.9 %) | 9.5 % (19.4 %) | 6.0 % (9.3 %) | 9.2 % (18.7 %) |