Figure 5. Effect of net channel strain in field-effect mobility.

Net compression (negative values) causes mobility increase and the opposite effect is observed for net channel tension (positive values). Different colour markers represent different devices. The s.e. in , calculated from the uncertainty of ɛ₀ and integration limits, is not visible in the present scale. Error bars in mobility change correspond to the s.e.m. from six independent measurements at different drain voltages in the linear regime, −5 to −15 V at −2 V steps. For experimental details on individual devices tested, see Supplementary Table 1.