Skip to main content
. 2014 Apr 4;1(3):137–139. doi: 10.14309/crj.2014.29

Figure 3.

Figure 3

Results of specialized testing with x-ray microanalyses. (A) High levels of silicon are demonstrated in the x-ray microanalysis from the biopsy specimen. The energy applied, measured in keV, is on the x axis, and the resulting counts are on the y axis. (B) An electron microscopy image of the silicon foreign body.