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. 2015 May 26;6:7238. doi: 10.1038/ncomms8238

Figure 1. Schematic of the FL-SFA.

Figure 1

The mica surfaces inside the SFA (centre) are back-coated with a quarter wave plate that allows for (i) reflection below 580 nm wavelength of light used for the multiple beam interference in standard SFA measurements, and (ii) transmission above 580 nm wavelength of light used for fluorescence microscopy. The quarter wave plate coating and the beam splitter allow for simultaneous measurements of SFA data and fluorescence imaging with only a small effect on the resolution or performance of both methods.