Skip to main content
. Author manuscript; available in PMC: 2015 Jun 5.
Published in final edited form as: Neuroreport. 2009 Nov 25;20(17):1518–1522. doi: 10.1097/WNR.0b013e328330377a

Fig. 3.

Fig. 3

Event-related potential (ERP) waveforms, and scalp topography of micro-rejection and relations with distress. (a) Frontal electrodes correlated with ostracism distress during micro-rejection events, highlighted in white (principal component analysis-derived window, 420–580 ms, false discovery rate controlled). (b) ERPs for the average of electrodes in (a), 10 least versus 10 most distressed participants. (c) Interpolated voltage map for low distress group. (d) Interpolated voltage map for high distress group. (e) Scatter plot of mean voltage data 420–580 ms for micro-rejection events and ostracism distress scores (n=27). (f) Scatter plot of mean ERP voltage data plotted for inclusion events during fair play (n= 27).