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. 2015 Jun 22;5:11466. doi: 10.1038/srep11466

Figure 3.

Figure 3

(a) S K-edge XANES of hyperdoped Si samples and pure S as a reference. Bottom panel shows the difference spectra of hyperdoped Si samples and reference pure S. (b) Si K-edge XANES of hyperdoped Si samples and reference undoped Si(100). Bottom panel shows the difference spectra of hyperdoped Si samples and reference Si(100). (c) FT of Si K-edge EXAFS spectra of hyperdoped Si samples for k between 2.3 and 12.5 Å−1. Inset plots EXAFS k3χ data.