Skip to main content
. Author manuscript; available in PMC: 2015 Jun 30.
Published in final edited form as: Appl Radiat Isot. 2013 Feb 13;75:85–94. doi: 10.1016/j.apradiso.2012.12.021

Figure 11.

Figure 11

XPS depth profiling of Ni anode with adsorbed fluoride by ion milling from 0 to 160 sec in 20 sec increments (front to back) showing Ni 2p (top), O 1s (middle), and F 1s (bottom) peaks. The composition % of Ni substrate increases as the surface is cleaned via ion etching. XPS spectra of O 1s and F1s suggest that fluoride and oxides are much more confined to the surface in comparison to that of Cu and Zn.