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. 2015 Jun 25;6:7430. doi: 10.1038/ncomms8430

Figure 1. Characterization of the MoS2 monolayer and device structure.

Figure 1

(a) AFM image of a triangular MoS2 monolayer. Inset shows the histogram analyses of multiple topographic AFM images confirmed the MoS2 film thickness to be ∼0.75 nm. (b) High-resolution TEM image of the synthesized MoS2 monolayer. Inset is the corresponding diffraction pattern. (c) A typical AFM image of a MoS2 monolayer device. (d) Schematic illustration of a MoS2 device under mechanical load applied by an AFM tip.