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. 2015 Jul 7;5:150. doi: 10.3389/fonc.2015.00150

Figure 14.

Figure 14

Left: FLUKA simulation of the depth-dose profile (hatched histogram) superimposed on the longitudinal profile of charged secondary particles (solid line) as a function of xPMMA, the primary beam direction. Right: the corresponding data (histogram) and data analysis (smooth line). Reproduced from Ref. (194), with permission.