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. 2015 Jul 8;5:12014. doi: 10.1038/srep12014

Figure 3. Characterization of defects and defect density by Raman spectroscopy.

Figure 3

(a) Raman spectra of graphene with different irradiation times from 10 seconds to 70 seconds; (b) D band mapping of the boundary of irradiated (with 30 seconds treatment) and un-irradiated regions in the graphene sample; (c) Intensity ratios of ID/IG and defect densities after different irradiation times; (d) Intensity ratios of I2D/IG after different irradiation times.