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. 2015 Jun 27;71(Pt 7):847–855. doi: 10.1107/S2053230X15009735

Table 4. X-ray diffraction data collection and processing.

Values in parentheses are for the highest resolution shell.

Sample for crystallization Tm1743NADP+EOPB Tm1743NADP+
Diffraction source Rigaku MicroMax-007 HF BL17U, SSRF
Wavelength () 1.5418 0.97923
Temperature (K) 100 100
Detector R-AXIS VI++ ADSC Q315r
Crystal-to-detector distance (mm) 130 450
Rotation range per image () 1 1
Total rotation range () 180 180
Exposure time per image (s) 300 1
Space group P3121 P3121
Unit-cell parameters (, ) a = b = 84.821, c = 93.727, = = 90, = 120 a = b = 84.922, c = 93.637 = = 90, = 120
Mosaicity () 1.10 0.47
Resolution range () 502.00 (2.032.00) 501.70 (1.731.70)
Total No. of reflections 255930 (12490) 377861 (23371)
No. of unique reflections 25576 (1301) 39524 (2164)
Completeness (%) 95.8 (98.4) 90.8 (100.0)
Multiplicity 10.0 (9.6) 9.6 (10.8)
I/(I) 9.8 (3.3) 15.2 (5.9)
R merge (%) 10.9 (0.0) 8.7 (99.3)
Overall B factor from Wilson plot (2) 40.51 24.5
Matthews coefficient V M (3Da1) 2.79 2.79
Solvent content (%) 55.9 56.0

R merge = Inline graphic Inline graphic, where Ii(hkl) is the intensity of the ith measurement of reflection hkl and I(hkl)is the mean intensity of all symmetry-related reflections.