Table 2. Data collection and processing.
Diffraction source | Beamline 17U, SSRF |
Wavelength () | 0.97915 |
Temperature (K) | 100 |
Detector | ADSC Q315 CCD |
Crystal-to-detector distance (mm) | 200 |
Rotation range per image () | 1 |
Total rotation range () | 180 |
Exposure time per image (s) | 0.5 |
Space group | P43212 |
a, b, c () | 63.35, 63.35, 125.90 |
, , () | 90, 90, 90 |
Mosaicity () | 0.305 |
Resolution range () | 31.681.494 (1.5471.494) |
Total No. of reflections | 581228 (57709) |
No. of unique reflections | 42094 (4168) |
Completeness (%) | 99.33 (100.00) |
Multiplicity | 13.8 (13.8) |
I/(I) | 23.41 (10.19†) |
R r.i.m. | 0.07757 (0.2352) |
Overall B factor from Wilson plot (2) | 14.12 |
The data set was collected at a suboptimal distance and data beyond 1.49 resolution were not collected.