(a-f) The transmission and corresponding SEM image are shown for a nanohole array with
periodicity of 500 nm and various etching times which cover the range of nanotriangle to
nanohole to defect ridden pattern. The hole diameters from (a-f): 500 nm, 470 nm, 440 nm,
410 nm, 320 nm, and 290 nm. The defective pattern still has sufficient periodicity to
support SPP and LSPR, albeit with a weakened response.