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. 2015 Jun 29;112(28):E3645–E3650. doi: 10.1073/pnas.1502330112

Fig. S4.

Fig. S4.

β-ΝMR measurements in pure and CrTI films. (A) Lineshapes of pure and CrTI at 0.4 and 1 keV. (B) The depth profile of lineshapes of pure at 20 K and (C) linewidth and Knight shift as a function of temperature and implantation energies. The GaAs layer is probed by the 10- and 19.9-keV beams.