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. 2015 Jul 16;10:4521–4533. doi: 10.2147/IJN.S83356

Figure 5.

Figure 5

The variation in the atomic percentages of Zn and O in the oxygen plasma–processed (left panel) and Ar-annealed (right panel) ZnO nanostructures.

Note: At high temperature annealing, a new Zn2SiO4 phase was also observed from the XRD results.

Abbreviation: XRD, X-ray diffraction.