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. 2015 Jul 13;6:7745. doi: 10.1038/ncomms8745

Figure 4. The tip-induced averaging effect in SKPM measurements.

Figure 4

(a) Schematic illustration of a finite-sized SKPM tip scanning over a cross-section of a multilayered thin-film device; (b) an illustration of the measured SP profile resulted from the convolution of the true profile with the transfer function of the SKPM tip.