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. 2015 Jul 31;71(Pt 8):1725–1735. doi: 10.1107/S1399004715010676

Three-dimensional data.

No. of images 76
Range of defocus (m) 0.21.5
IQ range used 17
Tilt range used () 060
Total No. of measurements 3251
Total No. of fitted unique reflections 1752
Overall weighted phase residual () 27.4
Completeness to 1.6nm with 60 tilt (%) 76
Effective resolution cutoffs (nm) 2.0 (in-plane), 2.0 (vertical)