No. of images | 76 |
Range of defocus (m) | 0.21.5 |
IQ range used | 17 |
Tilt range used () | 060 |
Total No. of measurements | 3251 |
Total No. of fitted unique reflections | 1752 |
Overall weighted phase residual () | 27.4 |
Completeness to 1.6nm with 60 tilt (%) | 76 |
Effective resolution cutoffs (nm) | 2.0 (in-plane), 2.0 (vertical) |