Fig. S7.

Model robustness. (A, B) Influence of an epithelial tension. (A) ($\tilde{\gamma },\hspace{0.17em}\tilde{\sigma })$ plane of the error landscape at D = 1.5 µm² h⁻¹ (logarithmic scale). The cross denotes the optimum, the red contour bounds the confidence region. (B) Optimal closure frequency map (linear scale), computed for $\tilde{\gamma }=7\hspace{0.17em}{\mu \text{m}}^2{\hspace{0.17em}\text{h}}^{-1};D=1.5\hspace{0.17em}{\mu \text{m}}^{2\hspace{0.17em}}{\text{h}}^{-1};\hspace{0.17em}\tilde{\sigma }=-0.15\hspace{0.17em}{\mu \text{m}\hspace{0.17em}\text{h}}^{-1}.$ (C, D) Influence of fluctuations of the cable tension. (C) The $(\tilde{\gamma },D_{\gamma })$ plane of the error landscape at D = 1.5 µm² h⁻¹ (logarithmic scale). The cross denotes the optimum, the red contour bounds the confidence region. (D) Optimal closure frequency map (linear scale), computed for $\tilde{\gamma }=10\hspace{0.17em}{\mu \text{m}}^2{\hspace{0.17em}\text{h}}^{-1};D=1.5\hspace{0.17em}{\mu \text{m}}^2{\hspace{0.17em}\text{h}}^{-1};D_{\gamma }=10\hspace{0.17em}{\mu \text{m}}^4{\hspace{0.17em}\text{h}}^{-1}.$