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. 2015 Aug 20;11(8):e1004165. doi: 10.1371/journal.pcbi.1004165

Table 3. Covariance (upper triangle and diagonal) and Spearman’s rank correlation (lower triangle only as diagonals would be unity) of the appropriately transformed Exponential Integrate-and-Fire model parameters log(C/pF), log(τ/ms), E (mV), V T (mV) and log(ΔT/mV) for each of the four cell classes.

The transformed parameters have normal marginal distributions and the combined sets satisfy at least one test for multivariate normality at the 5% level (see main text). All values are given to two significant figures.

Layer 2/3 Layer 4
log(C) log(τ) E V T log(ΔT) log(C) log(τ) E V T log(ΔT)
log(C) 0.066 −0.012 0.0047 −0.55 −0.012 0.083 0.0078 0.25 −0.25 −0.010
log(τ) −0.41 0.029 −0.099 0.28 −0.028 0.19 0.058 0.28 −0.0045 −0.0066
E 0.11 −0.22 18 7.8 −0.071 0.20 0.067 18 5.1 −0.38
V T −0.48 0.35 0.38 15 −0.42 −0.14 −0.025 0.29 12 −0.38
log(ΔT) 0.13 −0.43 −0.0016 −0.39 0.13 −0.13 −0.014 −0.30 −0.47 0.071
Slender-tufted layer 5 Thick-tufted layer 5
log(C) 0.063 0.022 0.49 −0.15 −0.02 0.075 0.004 0.16 −0.28 −0.021
log(τ) 0.34 0.065 0.28 −0.031 −0.019 0.031 0.052 0.070 −0.0054 −0.017
E 0.49 0.14 17 5.9 −0.65 0.16 0.066 16 5.3 0.22
V T −0.22 −0.086 0.35 13 −0.18 −0.33 0.088 0.29 13 0.25
log(ΔT) −0.20 −0.21 −0.23 −0.039 0.13 −0.20 −0.070 0.18 0.27 0.13