Skip to main content
. Author manuscript; available in PMC: 2015 Sep 1.
Published in final edited form as: J Mater Chem B. 2015 Feb 15;3(14):2816–2825. doi: 10.1039/C4TB02042A

Figure 3.

Figure 3

Static contact angle (θstatic) of surface-grafted silicon wafers at 0 s (dark) and 2 min (light) following placement of water droplet. Each bar represents the average and standard deviation of measurements performed in triplicate on four identically prepared samples.