Table 17.
SDD-EDS limits of detection, CDL for NIST microanalysis glass K497 (conditions: 500 s at 11 % deadtime; spectrum integral 0.1–15 keV = 87 million counts; C s = as-synthesized concentration) precision estimated from combined uncertainties in peak and background
| Element | C s (mass fraction) | C DL | C DL (ppm) |
|---|---|---|---|
| Ca | 0.00160 | 0.000041 ± 0.000003 | 41 ± 3 |
| Ti | 0.00210 | 0.000052 ± 0.000003 | 52 ± 3 |
| Fe | 0.00245 | 0.000072 ± 0.000004 | 72 ± 4 |
| CeL | 0.00619 | 0.000149 ± 0.000009 | 149 ± 9 |
| TaL | 0.00803 | 0.000329 ± 0.000030 | 329 ± 30 |
| PbM | 0.00919 | 0.000254 ± 0.000013 | 254 ± 13 |