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. 2015 Aug 12;6:8049. doi: 10.1038/ncomms9049

Figure 5. Ionization-induced recovery cross-section.

Figure 5

The cross-section is derived from samples with initial disorder levels S0 of 0.36 and 0.72 as a function of electronic energy loss. The effective cross-section depends on the ions (C, O, Si and Ni) and the initial damage state. The combined measurement and fitting uncertainty is <10%.