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. 2015 Sep 3;5:13483. doi: 10.1038/srep13483

Figure 2.

Figure 2

(a) Schematic cross-section and optical microscopic top view of the AgNW TLM pads and Ni/Au reference TLM pads. (b) I–V curves of the AgNW and the 7-, 10-, and 14-nm-thick Ni/Au TLM pads, as measured from adjacent contact pads with the spacing of 10 μm. (c) ρsc of the AgNW and the14-nm-thick Ni/Au electrodes versus the bias voltage and current density.