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. 2015 Jun 9;137(26):8419–8427. doi: 10.1021/jacs.5b01241

Figure 2.

Figure 2

Asymptotic fit of J at 1 V vs percentage of surface coverage for PSI on 2ME as directing SAM. The blue squares are the experimental points. The threshold limit of coverage is 23% as determined by imaging surfaces at different PSI:buffer concentrations and characterizing their behavior with an EGaIn tips. Inset images show PSI complexes on AuTS at different concentrations which correspond to the percent coverages shown. The devices were imaged on an AFM at 2.5 μm.