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. 2015 Sep 7;5:13832. doi: 10.1038/srep13832

Figure 1. Characterization of sol-gel prepared TiO2 thin films annealed at different temperatures.

Figure 1

(a) thermogravimetric analysis (TGA) curve of pre-dried PTA sol; (b) UV-Vis transmission spectra of the films on glass substrates; (c) refractive indices at 1550 nm wavelength and film thickness, both fitted from the UV-Vis spectra using the Swanepoel method; (d) refractive indices n and extinction coefficients k of TiO2 thin film annealed at 250 °C measured using ellipsometry; (e) FTIR spectra; (f) X-ray diffraction spectra; (g) AFM surface profile (1 μm × 1 μm); (h) top-view SEM image of film annealed at 250 °C; inset: film cross-section.