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. 2015 Sep 11;6:8182. doi: 10.1038/ncomms9182

Figure 2. Observation of surface carrier absorption (SCA) in Si waveguides.

Figure 2

(ab) Experimental technique developed to measure SCA from the intensity of the harmonic components at the output of the waveguide when a weakly modulated signal (at angular frequency ω0) is injected at the input. (c) The measured ratio between the fundamental and first harmonic rω=I(ω0)/I(2ω0) can be explained only with an absorption model that includes the effect of the waveguide surface (SCA). Two waveguide widths w, 480 nm and 1 μm, are considered.