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. Author manuscript; available in PMC: 2015 Sep 23.
Published in final edited form as: IEEE ASME Trans Mechatron. 2014 Nov 5;20(4):1920–1932. doi: 10.1109/TMECH.2014.2359413

TABLE III.

DETERIORATION FACTOR FOR PASSIVE AND ACTIVE TESTS

Protocol EP(%) EA(%)
T1W-FFE 0.000015 0.00012
T2W-TSE-Planning 0.00139 0.00019
T2W-TSE-Diagnosis 0.00036 0.00013