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. 2015 Sep 29;10:375. doi: 10.1186/s11671-015-1062-5

Fig. 9.

Fig. 9

a Ratios of SNOM signals to background signals plotted as a function of the analyzer, and b SNOM images of a Cr pattern on quart substrate measured with various angles of analyzer indicated in (a), 0°, 50°, 130°, 140°, 150°, and 230°