Figure 2.

X-ray diffraction (XRD) patterns of graphene oxide (GO), reduced graphene oxide (rGO), and rGO–Ag nanocomposite.

Notes: In the XRD pattern of GO, a strong sharp peak at 2θ=10.9° corresponds to an interlayer distance of 7.6 Å. rGO has a broad peak centered at 2θ=26.4° corresponding to an interlayer distance of 3.6 Å. Apart from the characteristic reflections of rGO (2θ=26.4°), the rGO–Ag nanocomposite shows two different distinct reflections in the diffractogram at 33.1° and 45.3° corresponding to the (111) and (200) planes, respectively, of face centered cubic Ag. At least three independent experiments were performed for each sample and reproducible results were obtained. The data present the results of a representative experiment.