Figure 1.
Characterization of Agg-, Lit- and PF87-MoS2. (A) Scanning electron micrograph of Agg-MoS2. (B, C) Representative atomic force microscopy (AFM) images of PF87-MoS2 and Lit-MoS2. (D) Optical absorbance spectra of PF87-MoS2 and Lit-MoS2. (E, F) AFM histograms of flake thickness and lateral flake sizes in the exfoliated materials.