Fig. (3).

Nanosized particles shown in these atomic force micrographs, are, in fact, not triangularly shaped as it appears. Just as images obtained using an electron microscope are the results of an interaction between the electron beam (controlled by lens properties and other settings) and the examined material, and as every visually perceived object is an intersection of the biological and cognitive predispositions of us as observers and the objects of our surrounding, the images obtained using an atomic force microscope are a convolution of the tip shape and the examined morphology. The microscope tip for some reason became triangularly shaped in this case, causing the observed particles to appear similarly triangular. As the critical dimensions of material systems become finer than ever, such a reflection of the properties of the measuring system in the measured data will become more present than ever.